So far so good solid running since yesterday..
root@nofapp:~ # smartctl -a /dev/ada0 | grep Reallocated_Sector
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 1
root@nofapp:~ # smartctl -a /dev/ada1 | grep Reallocated_Sector
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
oh wow ada0 might fail soon?
root@nofapp:~ # smartctl -a /dev/ada0 > test
root@nofapp:~ # less test
smartctl 6.5 2016-05-07 r4318 [FreeBSD 11.1-RELEASE-p1 amd64] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke,
www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: HITACHI HDS725050KLA360
Serial Number: ZBHVW3NH
LU WWN Device Id: 5 000cca 20eda4ef3
Firmware Version: K2AOAB0A
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA/ATAPI-7 T13/1532D revision 1
Local Time is: Fri Oct 27 18:36:06 2017 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (10419) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 174) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 159 159 050 Pre-fail Offline - 207
3 Spin_Up_Time 0x0007 110 110 024 Pre-fail Always - 591 (Average 677)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 1130
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 1
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 136 136 020 Pre-fail Offline - 31
9 Power_On_Hours 0x0012 097 097 000 Old_age Always - 27549
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1119
192 Power-Off_Retract_Count 0x0032 099 099 050 Old_age Always - 1485
193 Load_Cycle_Count 0x0012 099 099 050 Old_age Always - 1485
194 Temperature_Celsius 0x0002 141 141 000 Old_age Always - 39 (Min/Max 15/57)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 1
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 253 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
(END)