sudo /usr/local/sbin/smartctl -a -i -d 3ware,1 /dev/twe0 /dev/twe0
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smartctl 5.43 2012-06-30 r3573 [FreeBSD 8.2-STABLE i386] (local build)
Copyright (C) 2002-12 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar SE
Device Model: WDC WD1600JB-00GVC0
Serial Number: WD-WCAL97759170
Firmware Version: 08.02D08
User Capacity: 160,041,885,696 bytes [160 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 6
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Tue Jan 8 18:51:41 2013 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4623) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 62) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0007 163 160 021 Pre-fail Always - 4375
4 Start_Stop_Count 0x0032 100 100 040 Old_age Always - 78
5 Reallocated_Sector_Ct 0x0033 198 198 140 Pre-fail Always - 21
7 Seek_Error_Rate 0x000b 200 200 051 Pre-fail Always - 0
9 Power_On_Hours 0x0032 031 031 000 Old_age Always - 50638
10 Spin_Retry_Count 0x0013 100 253 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0013 100 253 051 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 78
194 Temperature_Celsius 0x0022 030 030 000 Old_age Always - 120
196 Reallocated_Event_Count 0x0032 196 196 000 Old_age Always - 4
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 1
198 Offline_Uncorrectable 0x0012 200 200 000 Old_age Always - 2
199 UDMA_CRC_Error_Count 0x000a 200 253 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0009 200 200 051 Pre-fail Offline - 1
SMART Error Log Version: 1
ATA Error Count: 4
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 4 occurred at disk power-on lifetime: 50621 hours (2109 days + 5 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
01 51 04 00 00 00 e0 Error: AMNF 4 sectors at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 04 00 00 00 00 00 01:14:07.050 READ DMA EXT
25 00 04 00 00 00 00 00 01:14:07.050 READ DMA EXT
ef 03 45 00 00 00 00 00 01:14:07.050 SET FEATURES [Set transfer mode]
e7 00 00 00 00 00 00 00 01:14:07.050 FLUSH CACHE
b0 d8 00 00 4f c2 00 00 01:14:07.050 SMART ENABLE OPERATIONS
Error 3 occurred at disk power-on lifetime: 50621 hours (2109 days + 5 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
01 51 04 00 00 00 e0 Error: AMNF 4 sectors at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 04 00 00 00 00 00 01:14:04.650 READ DMA EXT
ef 03 45 00 00 00 00 00 01:14:04.650 SET FEATURES [Set transfer mode]
e7 00 00 00 00 00 00 00 01:14:04.650 FLUSH CACHE
b0 d8 00 00 4f c2 00 00 01:14:04.650 SMART ENABLE OPERATIONS
ec 00 01 00 00 00 00 00 01:14:04.650 IDENTIFY DEVICE
Error 2 occurred at disk power-on lifetime: 50621 hours (2109 days + 5 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
01 51 04 00 00 00 e0 Error: AMNF 4 sectors at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 04 00 00 00 00 00 01:12:42.800 READ DMA EXT
25 00 04 00 00 00 00 00 01:12:42.800 READ DMA EXT
ef 03 45 00 00 00 00 00 01:12:42.800 SET FEATURES [Set transfer mode]
e7 00 00 00 00 00 00 00 01:12:42.800 FLUSH CACHE
b0 d8 00 00 4f c2 00 00 01:12:42.800 SMART ENABLE OPERATIONS
Error 1 occurred at disk power-on lifetime: 50621 hours (2109 days + 5 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
01 51 04 00 00 00 e0 Error: AMNF 4 sectors at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 04 00 00 00 00 00 01:12:40.400 READ DMA EXT
ef 03 45 00 00 00 00 00 01:12:40.400 SET FEATURES [Set transfer mode]
e7 00 00 00 00 00 00 00 01:12:40.400 FLUSH CACHE
b0 d8 00 00 4f c2 00 00 01:12:40.400 SMART ENABLE OPERATIONS
ec 00 01 00 00 00 00 00 01:12:40.400 IDENTIFY DEVICE
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 50365 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.